ISSN 2394-5125
 

Research Article 


Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips

Mr. Himanshu Yadav, Ms. Meenakshi Sharma.

Abstract
Atomic force microscope (AFM) gives high resolution surface imaging by scanning a sharp
nanotip over a surface while controlling the interaction force between Atomic force microscopy (AFM) tip and
the surface. The quality of surface imaging is depending on sharpness of the AFM probe. There are Different
types of Micro/Nanofabrication technologies for atomic force microscopy (AFM) probes have been
demonstrated, emphasizing the fabrication of versatile tip shapes. In this paper we will discuss about
Micro/Nanofabrication technique to get high aspect ratio Atomic force microscopy (AFM) probes. The tips with
well controlled dimensions are fabricated by crossed spacer technology and the flexibility of the cantilever and
the nanotips according to demand can be easily realized by designing the pattern and tuning the etching time in
the fabrication process. To demonstrate the innovation potential of this method, three different probe designs
were fabricated: a plane passive AFM probe, a probe with integrated electrostatic actuator, and a probe which
allows scanning on vertical sidewalls. The performance of the fabricated tips has been demonstrated by
scanning test structures in an atomic force microscope

Key words: Nanotip, Cantilever, Atomic force microscopy, Nanofabrication, High Aspect Ratio, AFM probes


 
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How to Cite this Article
Pubmed Style

Yadav MH, Sharma MM. Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. JCR. 2020; 7(3): 733-736. doi:10.31838/jcr.07.03.127


Web Style

Yadav MH, Sharma MM. Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. http://www.jcreview.com/?mno=120354 [Access: May 30, 2021]. doi:10.31838/jcr.07.03.127


AMA (American Medical Association) Style

Yadav MH, Sharma MM. Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. JCR. 2020; 7(3): 733-736. doi:10.31838/jcr.07.03.127



Vancouver/ICMJE Style

Yadav MH, Sharma MM. Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. JCR. (2020), [cited May 30, 2021]; 7(3): 733-736. doi:10.31838/jcr.07.03.127



Harvard Style

Yadav, M. H. & Sharma, . M. M. (2020) Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. JCR, 7 (3), 733-736. doi:10.31838/jcr.07.03.127



Turabian Style

Yadav, Mr. Himanshu, and Ms. Meenakshi Sharma. 2020. Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. Journal of Critical Reviews, 7 (3), 733-736. doi:10.31838/jcr.07.03.127



Chicago Style

Yadav, Mr. Himanshu, and Ms. Meenakshi Sharma. "Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips." Journal of Critical Reviews 7 (2020), 733-736. doi:10.31838/jcr.07.03.127



MLA (The Modern Language Association) Style

Yadav, Mr. Himanshu, and Ms. Meenakshi Sharma. "Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips." Journal of Critical Reviews 7.3 (2020), 733-736. Print. doi:10.31838/jcr.07.03.127



APA (American Psychological Association) Style

Yadav, M. H. & Sharma, . M. M. (2020) Fabrication of Nano-Scale Ultra Sharp Atomic Force Microscopy (AFM) Tips. Journal of Critical Reviews, 7 (3), 733-736. doi:10.31838/jcr.07.03.127