ISSN 2394-5125
 

Research Article 


THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa.

Abstract
The studies to improve the affection accumulation method for the case of influence to the semiconductor element base by the multi-frequency space-time signals have been conducted.
The estimates of the probability of affection of the semiconductor element under the influence of the multifrequency space-time signals have been obtained.
As a result of the researches conducted, the method of affection accumulation for the case of the influence of MF STS on the semiconductor element base has been improved. This method involves the usage of statistical characteristics of thermal energy to estimate the probability of degradation of the p-n junctions for normal (diodes, transistors) and equable (integrated circuits) distribution laws.

Key words: semiconductor, affection, probability, microprocessor technology, control system, space-time signal, mathematical model.


 
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How to Cite this Article
Pubmed Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. JCR. 2020; 7(9): 569-571. doi:10.31838/jcr.07.09.113


Web Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. http://www.jcreview.com/?mno=112219 [Access: May 30, 2021]. doi:10.31838/jcr.07.09.113


AMA (American Medical Association) Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. JCR. 2020; 7(9): 569-571. doi:10.31838/jcr.07.09.113



Vancouver/ICMJE Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. JCR. (2020), [cited May 30, 2021]; 7(9): 569-571. doi:10.31838/jcr.07.09.113



Harvard Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa (2020) THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. JCR, 7 (9), 569-571. doi:10.31838/jcr.07.09.113



Turabian Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. 2020. THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. Journal of Critical Reviews, 7 (9), 569-571. doi:10.31838/jcr.07.09.113



Chicago Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. "THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS." Journal of Critical Reviews 7 (2020), 569-571. doi:10.31838/jcr.07.09.113



MLA (The Modern Language Association) Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa. "THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS." Journal of Critical Reviews 7.9 (2020), 569-571. Print. doi:10.31838/jcr.07.09.113



APA (American Psychological Association) Style

Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Serhii Bazilo, Ivan Sharapa (2020) THE METHOD OF DETERMINING THE PROBABILITY OF AFFECTION OF THE SEMICONDUCTOR ELEMENTS UNDER THE INFLUENCE OF THE MULTIFREQUENCY SPACE-TIME SIGNALS. Journal of Critical Reviews, 7 (9), 569-571. doi:10.31838/jcr.07.09.113