ISSN 2394-5125
 

Research Article 


FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES

Sheetal Barekar, Madan Mali, Chhaya Gosavi.

Abstract
Resistive open defects in memory are gaining higher attention to the growing technology. With the advanced
deep submicron technology, effects of change in temperature, supply voltage and process variation are
stimulating to create numerous difficulties in the detection of the resistive open defect in memory. For assuring
the reliable operation of the circuit, it becomes crucial that memory used in system-on-chip should be faulttolerant.
This paper estimates the efficiency of the proposed Predischarged feeble cell detection technique used
to detect open resistive defect faults in SRAM memory array. The fault detection capabilities are examined for a
wide range of defect values at random locations in memory. The implementation of the proposed method gives
less time latency and minimum area overhead of 7.74% for 2KB of memory.

Key words: Fault Detection, Embedded Memory, SRAM Test, Redundant Elements, Resistive Defect


 
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Pubmed Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. JCR. 2020; 7(9): 2054-2061. doi:10.31838/jcr.07.09.342


Web Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. http://www.jcreview.com/?mno=104650 [Access: May 30, 2021]. doi:10.31838/jcr.07.09.342


AMA (American Medical Association) Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. JCR. 2020; 7(9): 2054-2061. doi:10.31838/jcr.07.09.342



Vancouver/ICMJE Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. JCR. (2020), [cited May 30, 2021]; 7(9): 2054-2061. doi:10.31838/jcr.07.09.342



Harvard Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi (2020) FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. JCR, 7 (9), 2054-2061. doi:10.31838/jcr.07.09.342



Turabian Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. 2020. FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. Journal of Critical Reviews, 7 (9), 2054-2061. doi:10.31838/jcr.07.09.342



Chicago Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. "FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES." Journal of Critical Reviews 7 (2020), 2054-2061. doi:10.31838/jcr.07.09.342



MLA (The Modern Language Association) Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi. "FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES." Journal of Critical Reviews 7.9 (2020), 2054-2061. Print. doi:10.31838/jcr.07.09.342



APA (American Psychological Association) Style

Sheetal Barekar, Madan Mali, Chhaya Gosavi (2020) FAULT TOLERANT SRAM ARRAY STRUCTURE FOR RELIABILITY ENHANCEMENT AGAINST FAILURES. Journal of Critical Reviews, 7 (9), 2054-2061. doi:10.31838/jcr.07.09.342