Abstract

The scanning electron microscope (SEM) is a powerful tool for studying surfaces at the nanoscale level that is utilised in a wide range of fields. SEM probes only a section of the complete image at a time, and the image is built up serially by scanning the probe. It has the ability to create high-resolution photographs of a sample surface. SEM is a device that focussed a beam of high energy electrons to generate a range of signals at the surface of solid specimens. It gives a visual display of the surface layer with a high depth of focus larger than that attainable with an ordinary electron microscope. The signals produced by electron sample interaction disclose information about the sample's exterior shape, chemical content, crystalline structure, and orientation of the materials that make it up. The incorporation of Mn into the host matrix was confirmed by a drop in (002) peak intensity and a minor change in peak location as Mn content increased. The presence of peaks in the XPS survey scan spectrum corresponding to Cd, Mn, and S validated the compositional purity of the deposited films. In this research study, the decrease in particle size with increasing Mn content was confirmed by scanning electron microscopy .

Description